Structural studies of amorphous semiconducting thin films using interference enhanced raman scattering
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Abstract
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Research context
OpenAlex topics: Thin-Film Transistor Technologies · Phase-change materials and chalcogenides · Glass properties and applications
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References (14)
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2. Connell, G. A. N., Nemanich, R. J. and Tsai, C. C., (to be published).
3. Nemanich, R. J., Tsai, C. C. and Connell, G. A. N., (to be published).
4. Knights · 1976 · 296
5. Lannin · 1976 · 123
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11. Biegelsen, D. K., Street, R. A., Tsai, C. C. and Knights, J. C., these Proceedings.
12. Fritzsche · Solid State Technology · 1978 · 21 · 55
13. Tsai · 1977 · 339
14. Nemanich · Phys. Rev. B · 1977 · 16 · 165510.1103/PhysRevB.16.1655 ↗