XPS study of glassy grain boundary layers in dense, high-strength silicon nitride
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OpenAlex topics: Advanced ceramic materials synthesis · Semiconductor materials and devices · Electron and X-Ray Spectroscopy Techniques
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References (16)
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1. Dudek · Microchim. Acta Suppl. · 1983
2. Jack · 1978 · Vol. 5
3. Drew · Special Ceramics · 1980 · 7 · 119
4. Clarke · J. Am. Ceram. Soc. · 1981 · 64 · 60110.1111/j.1151-2916.1981.tb10225.x ↗
5. Clarke · J. Am. Ceram. Soc. · 1981 · 64 · 60810.1111/j.1151-2916.1981.tb10226.x ↗
6. Hofmann · Powder Metallurgy International · 1974 · 6 · 90
7. Iskoe · 1974
8. Wagner · Surface and Interface Analysis · 1981 · 3 · 21110.1002/sia.740030506 ↗
9. Castle · J. Electron. Spectrosc. Relat. Phenom. · 1979 · 16 · 19510.1016/0368-2048(79)85018-5 ↗
10. Braue · 1982
11. Morgan · 1977 · 23
12. Adams · Earth Planet. Sci. Letters · 1972 · 16 · 42910.1016/0012-821X(72)90163-X ↗
13. Wittberg · J. Vac. Sci. Technol. · 1978 · 15 · 34810.1116/1.569544 ↗
14. Taylor · Applications of Surface Science · 1981 · 7 · 16810.1016/0378-5963(81)90068-4 ↗
15. Raider · J. Electrochem. Soc. · 1976 · 123 · 56010.1149/1.2132877 ↗
16. Lange · 1976