Resolution of the a-Si:H DLTS energy scale controversy
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Abstract
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OpenAlex topics: Semiconductor materials and devices · Thin-Film Transistor Technologies · Integrated Circuits and Semiconductor Failure Analysis
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References (5)
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1. Okushi · Phys. Rev. · 1982 · B25 · 431310.1103/PhysRevB.25.4313 ↗
2. Okushi · Phys. Rev. · 1983 · B27 · 518410.1103/PhysRevB.27.5184 ↗
3. Lang · Phys. Rev. · 1982 · B25 · 109
4. Cohen · Phys. Rev. Lett. · 1982 · 48 · 10910.1103/PhysRevLett.48.109 ↗
5. Chen · Appl. Phys. Lett. · 1984