Properties and applications of electron cyclotron plasma deposited SiOxNy films with graded refractive index profiles
Bibliographic record
Abstract
No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.
Source: Not provided · Quality: missing
Research context
OpenAlex topics: Optical Coatings and Gratings · Metal and Thin Film Mechanics · Copper Interconnects and Reliability
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (12)
Show source-provided references
1. Donovan · Appl. Opt. · 1989 · 28 · 294010.1364/AO.28.002940 ↗
2. Greenham · Opt. Eng. · 1993 · 32 · 101810.1117/12.130253 ↗
3. Gunning · Appl. Opt. · 1989 · 28 · 294510.1364/AO.28.002945 ↗
4. Southwell · Appl. Opt. · 1989 · 28 · 509110.1364/AO.28.005091 ↗
5. Verly · Appl. Opt. · 1989 · 28 · 286410.1364/AO.28.002864 ↗
6. Macleod · Laser Focus World · 1992 · 28 · 111
7. Bulkin · S. Afr. J. Phys. · 1993 · 16 · 33
8. Bulkin · Thin Solid Films · 1994 · 241 · 24710.1016/0040-6090(94)90434-0 ↗
9. Bulkin · Opt. Eng. · 1994 · 33 · 289410.1117/12.175695 ↗
10. Swanepoel · J. Phys. · 1983 · E16 · 1214
11. Southwell · Appl. Opt. · 1989 · 28 · 294910.1364/AO.28.002949 ↗
12. Discrete-Time Signal Processing