journal article·1970-01

Transient electrical measurements of amorphous chalcogenide thin films

James E. Hall

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Abstract

No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.

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Research context

OpenAlex topics: Phase-change materials and chalcogenides · Chalcogenide Semiconductor Thin Films · Semiconductor materials and interfaces

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

References (11)

Show source-provided references
1. Energy Conversion Devices, Troy, Michigan.
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4. Walsh · J. Non-Crystalline Solids · 1970 · 2 · 10710.1016/0022-3093(70)90126-2 ↗
5. DeFeo · Bull. Am. Phys. Soc. (II) · 1969 · 14 · 155
6. DeFeo · Picatinny Arsenal Internal Rept. ESL-IR 451 · 1969
7. Shanks · J. Non-Christalline Solids · 1970 · 2 · 50410.1016/0022-3093(70)90164-X ↗
8. Csillag · J. Non-Crystalline Solids · 1970 · 2 · 13310.1016/0022-3093(70)90128-6 ↗
9. Rose · Phys. Rev. · 1955 · 97 · 153A10.1103/PhysRev.97.322 ↗
10. Cohen · Phys. Rev. Letters · 1969 · 22 · 106510.1103/PhysRevLett.22.1065 ↗
11. Stocker · J. Non-Crystalline Solids · 1970 · 2 · 37110.1016/0022-3093(70)90152-3 ↗