The metal-amorphous silicon barrier, interpretation of capacitance and conductance measurements
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Abstract
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Research context
OpenAlex topics: Semiconductor materials and devices · Integrated Circuits and Semiconductor Failure Analysis · Electrostatic Discharge in Electronics
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References (7)
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1. Spear · Phil. Mag. · 1978 · B38 · 30310.1080/13642817808245332 ↗
2. Spear · Phil. Mag. · 1976 · 33 · 93510.1080/14786437608221926 ↗
3. Madan · J. Non-Cryst. Solids · 1976 · 20 · 23910.1016/0022-3093(76)90134-4 ↗
4. Madan · 1977 · 377
5. Snell · Phil. Mag. · 1979
6. Rhoderick · 1978
7. Padovani · Solid St. Electron. · 1966 · 9 · 69510.1016/0038-1101(66)90097-9 ↗