journal article·1996-05

Identification and explanation of peculiar features in hole SCLC-TOF in a-Si:H pin-diodes from numerical modelling

Rudolf Brüggemann, Gottfried H. Bauer

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Abstract

No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.

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Research context

OpenAlex topics: Semiconductor materials and devices · Integrated Circuits and Semiconductor Failure Analysis · Thin-Film Transistor Technologies

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References (11)

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11. Marshall · 1995 · 1