Light-induced annealing of hole trap states: A new aspect of light-induced changes in hydrogenated amorphous silicon

Details of light-induced annealing of hole trap state in undoped hydrogenated amorphous silicon (a-Si:H) have been studied; it has been found that prolonged illumination significantly reduces the density of hole trap states in the energy range deeper than 0.5 eV, and subsequent thermal annealing increases the density of hole trap states and restored the sample to the initial state before the illumination. We can speculate, from the experimental results and discussion in this work, that defect conversion processes are taking place during the long exposure to light; Si dangling bonds are generated from the precursors or latent sites which manifested as hole trap states located between 0.5 and 0.7 eV from the top of the valence band.