journal article·1997-01

Small angle X-ray diffraction study of a-Si:H/a-Ge:H multilayers: reflectivity modeling and thermal stability

E.L Zeballos-Velásquez, M.C.A Fantini

Journal of Non-Crystalline Solids· Volume 209· Issue 1-2
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Abstract

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OpenAlex topics: Thin-Film Transistor Technologies · Silicon Nanostructures and Photoluminescence · Semiconductor materials and interfaces

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References (31)

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