journal article·1996-03

Near-field microscopies in the study of glass

Jerzy Zarzycki

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Abstract

No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.

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Research context

OpenAlex topics: Force Microscopy Techniques and Applications · Near-Field Optical Microscopy · Integrated Circuits and Semiconductor Failure Analysis

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

References (17)

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13. Near Field Optics
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17. K. Ichikawa, private communication.