journal article·2007-07Open access

Vibrational behavior of a realistic amorphous-silicon model

J.K. Christie, S.N. Taraskin, S.R. Elliott

Journal of Non-Crystalline Solids· Volume 353· Issue 22-23

Abstract

The vibrational properties of a high-quality realistic model of amorphous silicon are examined. The longitudinal and transverse dynamical structure factors are calculated, and fitted to a damped harmonic oscillator (DHO) function. The width $Γ$ of the best-fit DHO to the longitudinal dynamical structure factor scales approximately as $k2$ for wavevectors $k\lesssim0.55\textrmÅ-1$, which is above the Ioffe-Regel crossover frequency separating the propagating and diffusing regimes, occurring at $k=0.38\pm0.03\textrmÅ-1$. Using the DHO function as a fitting function for the transverse dynamical structure factor (without theoretical justification), gives a dependence of $Γ\propto k^α$ with $α\sim2.5$ for wavevectors $k\lesssim0.7\textrmÅ-1$. There was no evidence for $Γ\propto k4$ behaviour for either polarization.
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Research context

OpenAlex topics: Material Dynamics and Properties · Phase-change materials and chalcogenides · Glass properties and applications

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

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