Depth profiling by XPS for corroded glass
Bibliographic record
Abstract
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Research context
OpenAlex topics: Ion-surface interactions and analysis · Electron and X-Ray Spectroscopy Techniques · Thin-Film Transistor Technologies
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References (5)
Show source-provided references
1. Bach · Glastech. Ber. · 1987 · 60 · 21
2. Pantano · Ceram. Bull. · 1981 · 60 · 1154
3. Smets · J. Am. Ceram. Soc. · 1982 · 65 · c10.1111/j.1151-2916.1982.tb10453.x ↗
4. Brow · J. Non-Cryst. Solids · 1988 · 107 · 110.1016/0022-3093(88)90084-1 ↗
5. Yamanaka · Bull. Gov. Ind. Res. Inst. · 1982 · 33 · 355