Structure of amorphous GexSe1−x and GexSeyZnz thin films: an EXAFS study
Source abstract
Abstract
Abstract Extended X-ray absorption fine structure (EXAFS) measurements have been made on thin films of a-Ge x Se 1− x with 0.2 x x x Se y Zn z films show that the lengths of Ge–Zn and Se–Zn bonds are 2.57±0.05 and 2.44±0.03 A, independent of the composition. Results on the atomic coordinations reveal that Zn is fourfold coordinated and preferentially bonds to Se atoms.
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Research context
OpenAlex topics: Phase-change materials and chalcogenides · Glass properties and applications · Crystal Structures and Properties
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References (18)
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