journal article·1983-12

Transport properties of amorphous Si1−xAux: Metal-insulator transition and

N. Nishida, T. Furubayashi, M. Yamaguchi, M. Shinohara, Y. Miura, Y. Takano, K. Morigaki, H. Ishimoto, K. Ono

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Abstract

No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.

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Research context

OpenAlex topics: Semiconductor materials and interfaces · Theoretical and Computational Physics · Thin-Film Transistor Technologies

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References (10)

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1. Rosenbaum · Phys. Rev. Lett · 1980 · 45 · 172310.1103/PhysRevLett.45.1723 ↗
2. Thomas · Phys. Rev. · 1982 · B25 · 428810.1103/PhysRevB.25.4288 ↗
3. Dodson · Phys. Rev. Lett. · 1981 · 46 · 4610.1103/PhysRevLett.46.46 ↗
4. Nishida · Solid State Communications · 1982 · 44 · 30510.1016/0038-1098(82)90455-0 ↗
5. Hertel · Phys. Rev. Lett. · 1983 · 50 · 74310.1103/PhysRevLett.50.743 ↗
6. Kaveh · J. Phys. · 1982 · C5 · L697
7. McMillan · Phys. Rev. · 1981 · B24 · 273910.1103/PhysRevB.24.2739 ↗
8. Dynes · Phys. Rev. Lett. · 1981 · 46 · 13710.1103/PhysRevLett.46.137 ↗
9. Fukuyama · J. Phys. Soc. Jpn. · 1982 · 51 · 110510.1143/JPSJ.51.1105 ↗
10. Maekawa · J. Phys. Soc. Jpn. · 1983 · 5210.1143/JPSJ.52.1352 ↗