Adequacy test of the fictive temperatures of silica glasses determined by IR spectroscopy

Adequacy of the fictive temperature determined by the IR spectroscopy method was examined for various silica glasses by measuring the extent of the memory effect. The IR method of fictive temperature measurement of silica glasses relies upon the assumption that a silica glass has a silica structural band with a unique wavenumber when it has a particular fictive temperature. Silica glasses with various impurities or added components such as Cl, F, and OH were given a cross-over heat-treatment and the extent of the resulting deviation of the wavenumber during the second stage heat-treatment at a constant temperature corresponding to the apparent fictive temperature of the sample was determined. Silica glasses containing high concentrations of water or fluorine exhibited distinct memory effects while glasses with low water concentration or Cl did not. These results seem to indicate that the main source of the memory effect in silica glasses is the composition fluctuation rather than density fluctuation. Thus, the IR method of determining the fictive temperature is adequate for high purity silica glasses even when the glass samples have unknown thermal history.