journal article·1998-05

From amorphous to polycrystalline thin films: dependence on annealing time of structural and electronic properties

T. Mohammed-Brahim, K. Kis-Sion, D. Briand, M. Sarret, O. Bonnaud, J.P. Kleider, C. Longeaud, B. Lambert

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Abstract

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Research context

OpenAlex topics: Thin-Film Transistor Technologies · Silicon Nanostructures and Photoluminescence · Silicon and Solar Cell Technologies

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References (12)

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