Stress measurements in sol-gel films
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Abstract
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Research context
OpenAlex topics: Semiconductor materials and devices · Glass properties and applications · Photorefractive and Nonlinear Optics
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References (12)
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1. Dislich · Thin Solid Films · 1981 · 77 · 12910.1016/0040-6090(81)90369-2 ↗
2. D. Butts, Alfred University, private communication.
3. Talystep 1L Surface Profilometer, Rank Taylor Hobson Ltd., Leicester, England.
4. Shindo · Polym. Commun. · 1983 · 24 · 240
5. Shindo · Polym. Commun. · 1984 · 25 · 378
6. Jacobs · Appl. Opt. · 1982 · 21 · 452610.1364/AO.21.004526 ↗
7. Jacobs · LLE Review · 1982 · 10 · 3
8. Jacobs · Thin Solid Films · 1986 · 144 · 6910.1016/0040-6090(86)90070-2 ↗
9. Optical thin films II: new developments
10. The physics of rubber elasticity
11. Sakka · J. Non-Cryst. Solids · 1980 · 42 · 40310.1016/0022-3093(80)90040-X ↗
12. Unpublished results (March 1987).