journal article·1997-02

Characterization of the elastic properties of amorphous silicon carbide thin films by acoustic microscopy

B Cros, E Gat, J.M Saurel

Journal of Non-Crystalline Solids· Volume 209· Issue 3
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Abstract

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Research context

OpenAlex topics: Thin-Film Transistor Technologies · Advanced Surface Polishing Techniques · Force Microscopy Techniques and Applications

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References (15)

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