journal article·1987-12

Study of surface/interface and bulk defect density in a-Si:H by means of photothermal deflection spectroscopy and photoconductivity

M. Favre, H. Curtins, A.V. Shah

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Abstract

No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.

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Research context

OpenAlex topics: Thin-Film Transistor Technologies · Thermography and Photoacoustic Techniques · Silicon and Solar Cell Technologies

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References (12)

Show source-provided references
1. Smith · Appl. Phys. Lett. · 1987 · 50 · 152110.1063/1.97819 ↗
2. Jackson · Appl. Phys. Lett. · 1983 · 42 · 10510.1063/1.93762 ↗
3. Boulitrop · J. Appl. Phys. · 1985 · 58 · 349410.1063/1.335773 ↗
4. H. Curtins et-al. Proc. IEEE Photovoltaic Specialist Conf. New Orleans, May 4–8, 1987
5. Spear · J.of Non-Cryst. Solids · 1983 · 59 · 110.1016/0022-3093(83)90514-8 ↗
6. Curtins · Electronics Lett. · 1986 · 23 · 22810.1049/el:19870160 ↗
7. Curtins · 1987
8. Jackson · Phys. Rev. B · 1982 · 25 · 555910.1103/PhysRevB.25.5559 ↗
9. Tiedje · J. of Non-Cryst. Solids · 1985 · 77&78 · 103110.1016/0022-3093(85)90837-3 ↗
10. Stutzmann · Rev. B · 1985 · 32 · 2310.1103/PhysRevB.32.23 ↗
11. Wronski · 1987
12. Y. Ziegler, University Neuchâtel, IMT, 1987 (unpublished)