journal article·1991

Microscopic origin of the light-induced defects in hydrogenated nitrogen-rich amorphous silicon nitride films

J. Kanicki, W.L. Warren, C.H. Seager, M.S. Crowder, P.M. Lenahan

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Abstract

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Research context

OpenAlex topics: Thin-Film Transistor Technologies · Silicon Nanostructures and Photoluminescence · Semiconductor materials and devices

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References (17)

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12. Warren · Appl. Phys. Lett. · 1991
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