The fundamental absorption of amorphous Ge, Si and GeSi alloys
Bibliographic record
Abstract
No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.
Source: Not provided · Quality: missing
Research context
OpenAlex topics: Surface Roughness and Optical Measurements · Thin-Film Transistor Technologies · Silicon Nanostructures and Photoluminescence
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (13)
Show source-provided references
1. Tauc · 1965 · 606
2. Clark · Phys. Rev. · 1967 · 154 · 75010.1103/PhysRev.154.750 ↗
3. Donovan · Phys. Rev. Letters · 1969 · 22 · 105810.1103/PhysRevLett.22.1058 ↗
4. Braunstein · Phys. Rev. · 1958 · 109 · 69510.1103/PhysRev.109.695 ↗
5. Tauc · J. Phys. Chem. Solids · 1961 · 20 · 19010.1016/0022-3697(61)90004-X ↗
6. Schmidt · Phys. Status Solidi · 1968 · 27 · 5710.1002/pssb.19680270105 ↗
7. Wales · Thin Solid Films · 1967 · 1 · 13710.1016/0040-6090(67)90010-7 ↗
8. Paul · 1966
9. Herman · Phys. Rev. Letters · 1968 · 21 · 157510.1103/PhysRevLett.21.1575 ↗
10. Richter · Z. Naturforsch. · 1958 · 13a · 98810.1515/zna-1958-1109 ↗
11. Brust · Phys. Rev. · 1965 · 139 · A48910.1103/PhysRev.139.A489 ↗
12. Kane · Phys. Rev. · 1966 · 146 · 55810.1103/PhysRev.146.558 ↗
13. Grigorovici · Thin Solid Films · 1968 · 1 · 10510.1016/0040-6090(68)90016-3 ↗