Phototransport spectroscopy of a-Si:H and μc-Si:H

Abstract The spectroscopic methods used for the determination of the density of states (DOS) map in hydrogenated amorphous silicon (a-Si:H) and hydrogenated microcrystalline silicon (μc-Si:H) have a common drawback in that they do not give a reliable–unique fit of a model–map to experimental data. Only consistency checks of a given model by sets of data, from few types of measurements, can yield confidence in a model. In this paper we show that four sets of phototransport data can serve this purpose, thus yielding more reliable DOS maps than each of the currently popular methods. We also describe briefly a few achievements of our, above outlined, approach.