journal article·2014-08

Raman and AFM studies of (As2S3)0.45(SbSI)0.55 thin films and bulk glass

Yu.M. Azhniuk, A. Villabona, A.V. Gomonnai, V.M. Rubish, V.M. Marjan, O.O. Gomonnai, D.R.T. Zahn

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Abstract

Abstract (As 2 S 3 ) 0.45 (SbSI) 0.55 thin films were studied by Raman spectroscopy and atomic force microscopy. Laser-induced crystallization of SbSI crystallites from the amorphous (As 2 S 3 ) 0.45 (SbSI) 0.55 thin films was observed in micro-Raman measurements as a result of local laser beam heating. The dependence of the observed effect on the laser power and the film pre-heating duration is discussed. No such effects were observed for bulk glasses with a similar composition.
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Research context

OpenAlex topics: Phase-change materials and chalcogenides · Glass properties and applications · Chalcogenide Semiconductor Thin Films

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

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