Characterization of the protocrystalline silicon multilayer
Source abstract
Abstract
AbstractThe protocrystalline silicon (pc-Si:H) multilayer solar cell is very promising owing to its fast stabilization with low degradation againstlight irradiation. However, the pc-Si:H multilayers have not extensively been investigated in detail on its material characteristics yet. Wepresent the material characteristics of pc-Si:H multilayers using a transmission electron microscopy (TEM), Fourier transform infra(FTIR) spectroscopy, Raman spectroscopy, constant photocurrent method (CPM) and quantum efficiency (QE) measurement. ATEM micrograph shows that a pc-Si:H multilayer has a repeatedly layered structure consisting of low hydrogen-diluted and highlyhydrogen-diluted sublayers. FTIR spectra depict the strong vibration mode at 2090 cm 1 which is attributed to hydrogen-rich amor-phous silicon (a-Si:H) regions of highly hydrogen-diluted sublayers. Based on these results, excellent light-soaking behavior of the pc-Si:H multilayers is primarily due to the repeatedly layered structure that improves a structural order in the material. 2006 Elsevier B.V. All rights reserved.
Source: openaire · Quality: candidate unverified · Source record ↗
Research context
OpenAlex topics: Thin-Film Transistor Technologies · Silicon and Solar Cell Technologies · Silicon Nanostructures and Photoluminescence
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (13)
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