Depth profiling of defects in a-Si:H by photothermal deflection spectroscopy
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Research context
OpenAlex topics: Thermography and Photoacoustic Techniques · Thin-Film Transistor Technologies · Calibration and Measurement Techniques
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References (7)
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7. Toyoshima · Appl.Phys.Lett. · 1990 · 57 · 102810.1063/1.103555 ↗