Fractal and multifractal analysis on fused silica glass formed by bound abrasive grain mediated grinding using diamond grits
Source abstract
Abstract
Optical component fabrication involves highly controlled polishing and lapping methods. The method used for polishing and lapping depends upon the application and the properties required. The main properties of materials for the optical purpose are roughness (Ra) and Subsurface damage (SSD). The control of these parameters has to be done right from the early stages of lapping. This work is based on the fractal and multifractal based study on the surface roughness of fused silica glass samples lapped with a deterministic grinding method using abrasives, diamond particles embedded in different matrixes such as metal bound and resin-bound of different grit sizes. White light interferometry is carried out to study the average roughness of the samples. A field emission scanning electron microscope (FESEM) was used to take the images of the samples. Fractal and multifractal analyses are done to find the relation between the fractal parameters and the average roughness of the sample formed for different grit sizes of the matrix as well as different abrasives used.
Source: expertdata · Quality: candidate unverified · Source record ↗
Research context
OpenAlex topics: Surface Roughness and Optical Measurements · Advanced Surface Polishing Techniques · Laser Material Processing Techniques
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (45)
Show source-provided references
1. Bak · 1996
2. Falconer · 2013
3. Fractal dimension of chaotic light scattering in regular polyhedral mirror ball structures10.1103/PhysRevE.76.046213 ↗
4. Self-similar magnetoresistance of a semiconductor sinai billiard10.1103/PhysRevLett.78.1952 ↗
5. Vicsek · 1992
6. Multifractal detrended partial cross-correlation analysis on Asian markets
7. Multifractal detrended cross-correlation analysis of genome sequences using chaos-game representation10.1016/j.physa.2016.03.074 ↗
8. Detrended fluctuation analysis for fractals and multifractals in higher dimensions10.1103/PhysRevE.74.061104 ↗
9. Multifractal detrended fluctuation analysis for image texture feature representation10.1142/S0218001414550052 ↗
10. Performance of a high-dimensional R/S method for Hurst exponent estimation10.1016/j.physa.2008.08.014 ↗
11. Marinescu · 2007
12. Karow · 1993
13. Horne · 1983
14. Marinescu · 2007
15. Three-dimensional metrology and fractal analysis of dendritic nanostructures10.1103/PhysRevB.78.205428 ↗
16. Multifractal characterization of soil pore systems10.2136/sssaj2003.1361 ↗
17. Fractal measures, and their singularities: the characterization of strange sets10.1103/PhysRevA.33.1141 ↗
18. Fractal measures, and their singularities: the characterization of strange sets10.1103/PhysRevA.33.1141 ↗
19. Direct determination of the f(α) singularity spectrum and its application to fully developed turbulence10.1103/PhysRevA.40.5284 ↗
20. Fractal dimension and lacunarity of bulk density determined with X-ray computed tomography10.2136/sssaj1996.03615995006000060016x ↗
21. Characterizing the lacunarity of random and deterministic fractal sets10.1103/PhysRevA.44.3552 ↗
22. http://rsb.info.nih.gov/ij/plugins/fraclac/FLHelp/Introduction.htm (accessed 2020).
23. Fractal and multifractal analysis of In-doped ZnO thin films deposited on glass, ITO, and silicon substrates10.1007/s00339-019-2398-y ↗
24. Multifractal analysis of ITO thin films prepared by electron beam deposition method10.1016/j.apsusc.2007.09.015 ↗
25. Fractal and multifractal analysis of LiF thin film surface10.1016/j.apsusc.2012.08.053 ↗
26. Fractal features of CdTe thin films grown by RF magnetron sputtering10.1016/j.apsusc.2015.09.048 ↗
27. Atomic force microscopy study, kinetic roughening and multifractal analysis of electrodeposited silver films10.1016/j.apsusc.2016.07.134 ↗
28. Multifractal analysis of the fracture surfaces of foamed polypropylene/polyethylene blends10.1016/j.apsusc.2008.11.014 ↗
29. Multifractal, structural, and optical properties of Mn-doped ZnO films10.1016/j.apsusc.2012.07.150 ↗
30. Multifractal spectra of scanning electron microscope images of SnO2 thin films prepared by pulsed laser deposition10.1016/j.physleta.2005.05.104 ↗
31. Multifractality analysis of crack images from indirect thermal drying of thin-film dewatered sludge10.1016/j.physa.2011.03.011 ↗
32. Multifractal analysis of sputtered CaF2 thin films10.1002/sia.5321 ↗
33. Multifractal properties of Pyrex and silicon surfaces blasted with sharp particles10.1016/j.physa.2007.11.026 ↗
34. Investigating the nanostructured gold thin films using the multifractal analysis10.1007/s00339-014-8636-4 ↗
35. Multifractal, structural, and optical properties of Mn-doped ZnO films10.1016/j.apsusc.2012.07.150 ↗
36. Atomic force microscopy study, kinetic roughening and multifractal analysis of electrodeposited silver films10.1016/j.apsusc.2016.07.134 ↗
37. Multifractal spectra of atomic force microscope images of lanthanum oxide thin films deposited by electron beam evaporation10.1016/j.mssp.2014.11.011 ↗
38. Multifractal analysis of textured silicon surfaces10.1016/j.apsusc.2014.02.102 ↗
39. Multifractal analysis and optical properties of nanostructured silicon layers10.1016/j.apsusc.2016.04.059 ↗
40. Multifractal analysis of tensile toughness and filler dispersion for polypropylene–CaCO3 composites10.1016/j.apsusc.2012.05.124 ↗
41. Multifractal analysis of fracture morphology of poly (ethylene-co-vinyl acetate)/carbon black conductive composite10.1016/j.apsusc.2010.05.042 ↗
42. Multifractal analysis of the tensile fracture morphology of polyvinylidene chloride/glass fiber composite10.1016/j.apsusc.2010.10.104 ↗
43. Analyzing the LiF thin films deposited at different substrate temperatures using multifractal technique10.1016/j.tsf.2014.04.005 ↗
44. Microstructural changes and fractal Ge nanocrystallites in polycrystalline Au/amorphous Ge thin bilayer films upon annealing10.1088/0022-3727/39/21/005 ↗
45. Fractal processing of AFM images of rough ZnO films10.1016/S1044-5803(02)00205-X ↗