Dangling bonds in amorphous silicon investigated by multifrequency EPR
Source abstract
Abstract
Paramagnetic coordination defects in undoped hydrogenated amorphous silicon (a-Si:H) are studied using multifrequency pulsed electron-paramagnetic resonance (EPR) spectroscopy at S-, X-, Q- and W-band microwave frequencies (3.6, 9.7, 34, and 94 GHz, respectively). The improved spectral information extractable from a multifrequency fitting procedure allows us to conclude that the g tensor exhibits a rhombic splitting instead of axial symmetry. Our methods allow for precise and accurate determination of the g tensor principal values gx = 2.0079(2), gy = 2.0061(2) and gz = 2.0034(2) and their distribution parameters (g strain).
Source: openaire · Quality: candidate unverified · Source record ↗
Research context
OpenAlex topics: Thin-Film Transistor Technologies · Electron Spin Resonance Studies · Magneto-Optical Properties and Applications
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References (19)
Show source-provided references
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