journal article·2000-05

Optics of textured amorphous silicon surfaces

P.I. Rovira, A.S. Ferlauto, Joohyun Koh, C.R Wronski, R.W. Collins

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Abstract

We have performed real time Stokes vector spectroscopy (also called polarimetry) during the preparation of hydrogenated amorphous silicon (a-Si:H) p‐i‐n solar cells on textured tin-oxide (SnO2) surfaces. With this spectroscopy (1.5‐4.0 eV), the irradiance, Ir, and polarization parameters,fOQ; vU; pg, for the specularly reflected beam are obtained with 0.8 s resolution versus time during solar cell preparation. Here Q and v are the tilt and ellipticity angles of the polarization state, respectively, and p is the degree of polarization. From an analysis of these spectra, we establish a model for textured a-Si:H intrinsic-layer growth that includes both microscopic and macroscopic structural components. Using such a model, the evolution of structural and optical properties of the solar cell components can be determined, and the results provide realistic inputs for optical modeling of solar cells. ” 2000 Elsevier Science B.V. All rights reserved.
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Research context

OpenAlex topics: Thin-Film Transistor Technologies · Silicon and Solar Cell Technologies · Silicon Nanostructures and Photoluminescence

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References (11)

Show source-provided references
1. Niklasson · Appl. Opt. · 1981 · 20 · 2610.1364/AO.20.000026 ↗
2. Aspnes · Thin Solid Films · 1982 · 89 · 24910.1016/0040-6090(82)90590-9 ↗
3. Beckmann · 1963
4. J.M. Bennett, L. Mattsson, Introduction to Surface Roughness and Scattering, vol. 1, Optical Society of America, New York, 1990
5. Lee · Rev. Sci. Instrum. · 1998 · 69 · 180010.1063/1.1148844 ↗
6. Rovira · J. Appl. Phys. · 1999 · 85 · 201510.1063/1.369496 ↗
7. Williams · Phys. Rev. Lett. · 1978 · 41 · 166710.1103/PhysRevLett.41.1667 ↗
8. P.I. Rovira, A.S. Ferlauto, I. An, H. Fujiwara, J. Koh, R.J. Koval, C.R. Wronski, R.W. Collins, in: Proceedings of the 1999 Spring Meeting of the Materials Research Society, Symposium A, 1999, Materials Research Society, Pittsbugh, PA, 1999, p. 719
9. An · Appl. Phys. Lett. · 1991 · 59 · 254310.1063/1.105947 ↗
10. Jellison · Appl. Phys. Lett. · 1996 · 69 · 213710.1063/1.118155 ↗
11. J.M. Eastman, in: G. Hass, M.H. Francombe (Eds.) Physics of Thin Films: Advances in Research and Development, vol. 10, Academic Press, New York, 1978, p. 167