Thickness dependence of staebler-wronski effect in a-Si:H
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OpenAlex topics: Thin-Film Transistor Technologies · Silicon Nanostructures and Photoluminescence · CCD and CMOS Imaging Sensors
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References (8)
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3. Lang · Appl. Phys. Lett. · 1982 · 40 · 47410.1063/1.93139 ↗
4. Jousse · Appl. Phys. Lett. · 1980 · 37 · 20810.1063/1.91827 ↗
5. Dersch · Appl. Phys. Lett · 1981 · 38 · 45610.1063/1.92402 ↗
6. Tetrahedrally Bonded Amorphous Semiconductors
7. Nitta · J. de Phys. · 1981 · C4 · 403
8. Ast · J. Non-Crystalline Solids · 1980 · 35/36 · 66110.1016/0022-3093(80)90662-6 ↗