Micro-Raman study of indium doped zirconia obtained by sol–gel

Indium doped zirconia powders were prepared by sol–gel process, with different indium concentrations. The structural characterization was carried out by X-ray diffraction (XRD), micro Raman and N2 adsorption at 77 K. The addition of indium stabilizes the tetragonal ZrO2 phase and influences the specific surface area. Rhodium salt impregnation on both indium doped and pure zirconia maintains the tetragonal phase at low temperatures. 2004 Elsevier B.V. All rights reserved.