Phase separation in Ag–Ge–Se glasses
Source abstract
Abstract
Abstract Field emission-scanning electron microscopy (FE-SEM) and electric force microscopy (EFM) measurements were carried out on bulk Agx(Ge0.25Se0.75)100−x glasses with x = 5 and 15 at.%. The presence of chemical contrasts and electrical inhomogeneity throughout the samples indicated that the glasses were phase separated. Moreover it appears that while silver-rich nodules of ∼1 μm were embedded in a silver-poor connecting phase in the glass containing 5 at.% Ag, it was the opposite that occurred in the glass containing 15 at.% Ag. Such an inversion explains the large difference of seven orders of magnitude in the conductivity of the two glasses.
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Research context
OpenAlex topics: Phase-change materials and chalcogenides · Chalcogenide Semiconductor Thin Films · Glass properties and applications
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References (14)
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