Structural relaxation of SiO2 at elevated temperatures monitored by in situ Raman scattering

Abstract Raman scattering spectra of high-purity synthetic silica glass were measured in situ in the temperature range from 950 to 1200 °C by means of an experimental approach which gives very low thermal background. The temperature dependence of the scattering permits an analysis of the spectra into the first-order and overtone contributions in a consistent manner. For low-OH content the dynamics of relaxation of the D 2 defect follow a single exponential decay, but more complex relaxation is found when OH content is high. In the latter case a double-exponential fit describes the observed relaxation well. The activation energies found are: for creation of D 2 defects 0.53 ± 0.07 eV; for single exponential relaxation in low-OH material, 6.0 ± 0.3 eV; for high-OH material, primary relaxation 5.1–5.2 ± 0.3 eV, secondary relaxation 2.4–2.5 ± 0.5 eV.