Structural and electrical properties of AgI dispersed As-chalcogenide glasses

Abstract X-ray diffraction, EXAFS and Raman spectroscopic studies, together with transport phenomena measurements, have been carried out for (AgI) x (As 2 Se 3 ) 1− x glasses in order to investigate the ionic conduction mechanism in AgI doped non-oxide glasses. The addition of AgI into As 2 Se 3 glass is responsible for a pronounced increase in the electrical conductivity. Particularly, the ionic component of the electrical conductivity is dominant in highly doped glasses. Results of Raman spectra, EXAFS measurements and least squares fitting analysis for observed X-ray structural functions suggest that the local structure of the present glasses can be described as a pseudo-binary mixture of As–Se networks and fourfold coordinated AgI clusters.