journal article·1972-06

Structure determination of amorphous Ge, GeO2 and GeSe by fourier analysis of extended x-ray absorption fine structure (EXAFS)

Dale E. Sayers, Farrel W. Lytle, Edward A. Stern

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Abstract

No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.

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Research context

OpenAlex topics: Glass properties and applications · Phase-change materials and chalcogenides · Luminescence Properties of Advanced Materials

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References (12)

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1. Sayers · 1970 · Vol. 13 · 248
2. D. E. Sayers, E. A. Stern and F. W. Lytle, submitted to Phys. Rev. Letters.
3. X-ray Diffraction
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5. Lytle · 1966 · Vol. 9 · 398
6. Ch-Unhua · Russ. J. Inorg. Chem. · 1962 · 7 · 1117
7. Shevchik · J. Non-Crystalline Solids · 1972 · 8–10 · 38110.1016/0022-3093(72)90164-0 ↗
8. Moss · 1970 · 658
9. D. W. Polk, J. Phys. Chem. Glasses, to be published.
10. Zarzycki · Verres Réfractaires · 1957 · 11 · 3
11. Nelson · Phys. Rev. · 1962 · 127 · 610.1103/PhysRev.127.2025 ↗
12. Wyckoff · 1963 · Vol. 1