journal article·2016-08

Detection of “free” oxide ions in low-silica Ca/Mg silicate glasses: Results from 17O →29Si HETCOR NMR

Ivan Hung, Zhehong Gan, Peter L. Gor'kov, Derrick C. Kaseman, Sabyasachi Sen, Michelle LaComb, Jonathan F. Stebbins

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Abstract

Abstract Silicon and oxygen are the two most abundant elements in most technological and geological glasses and glass-forming liquids, and extensive studies of the structures of these materials have been made using 29 Si and 17 O high-resolution solid-state NMR. Double resonance NMR experiments hold great potential for revealing new details about the network structures of such important materials but have not yet been done for this particular pair of spins because of several technical challenges. Using a crystalline model compound, Ca 3 SiO 5 (calcium trisilicate or the ‘alite’ phase of Portland cement), which contains oxide ion sites bonded either to one Si 4 + or only to Ca 2 + , we demonstrate that the 17 O → 29 Si Cross-Polarization Heteronuclear Correlation (CP-HETCOR) experiment can clearly distinguish between these two types of oxygen sites. The latter species, so-called ‘free’ oxide ions that are bonded to no network cations such as Si 4 + , play an important role in models of glass and melt structure but have been difficult to directly detect in many systems. In two Ca/Mg silicate glasses near to the orthosilicate composition (O/Si ≥ 4), the HETCOR experiment clearly shows the presence of such ‘free’ oxide ions, whose 1D 17 O NMR signals are actually completely hidden under those for the predominant non-bridging oxygens. Their observed chemical shifts suggest coordination by predominantly Mg 2 + cations, an ordering that may be expected from the smaller size and stronger bonding interactions of this cation relative to those of Ca 2 + . The estimated abundances of ‘free’ oxide ions in these glasses are consistent with previous, indirect estimates based on analyses of 1D 29 Si NMR spectra.
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OpenAlex topics: Advanced NMR Techniques and Applications · NMR spectroscopy and applications · Glass properties and applications

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