Characterization of thermal poling in silica glasses by current measurements

Abstract We present herein a charge migration model that predicts the electric field distribution within a Suprasil™ silica planar sample after poling. The predicted distribution is in agreement with the currents measured at the electrodes during the poling and depoling processes. This electric field is responsible for an apparent second-order non-linear coefficient originating from the third-order one. Numerical values obtained from fits of the experimental curves with the model equations are compatible with the values obtained by optical characterization reported in the literature.