journal article·2006-07

Holographic recording in amorphous As2S3 films at 633 nm

A. Ozols, Dm. Saharovs, M. Reinfelde

Journal of Non-Crystalline Solids· Volume 352· Issue 23-25
Publisher page

Abstract

Abstract Holographic grating recording with focused (light intensity I = 14–124 W/cm 2 ) and unfocused ( I = 0.50–0.78 W/cm 2 ) 633 nm He–Ne laser sub-bandgap light in non-annealed and annealed a-As 2 S 3 films has been experimentally studied. The focused light recording is found to be much more efficient (diffraction efficiency up to 14.9%, specific recording energy down to 216 J/(cm 2 %)) than the unfocused light recording (0.11%, 72 400 J/(cm 2 %)). Some other properties are also different. The hologram lifetime of more than two years and positive refractive index changes take place in the case of focused recording versus two days and negative refractive index changes for unfocused recording. The absence of measureable photoinduced thickness changes and a slight photobleaching are common properties. The focused light recording is explained by the photostimulated relaxational structural changes (RSC) accompanied by the photoinduced generation and recharging of D-centers. The unfocused light recording is explained by the photorientation of D-centers with some contribution of RSC.
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Research context

OpenAlex topics: Phase-change materials and chalcogenides · Photorefractive and Nonlinear Optics · Advanced Optical Imaging Technologies

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References (23)

Show source-provided references
1. Schwartz · 1993
2. Teteris · J. Optoelectron. Adv. Mater. · 2003 · 4 · 687
3. Ozols · Proc. SPIE · 1997 · 2968 · 28210.1117/12.266849 ↗
4. Shpotyuk · Phys. Status Solidi (B) · 1994 · 183 · 36510.1002/pssb.2221830203 ↗
5. Hisakuni · Appl. Phys. Lett. · 1994 · 65 · 292510.1063/1.112533 ↗
6. Tyurin · Solid State Phys. · 1996 · 38 · 379
7. Ozols · Phys. Rev. B · 1996 · 55 · 1423610.1103/PhysRevB.55.14236 ↗
8. Meneghini · J. Opt. Soc. Am. B · 1998 · 15 · 294610.1364/JOSAB.15.002946 ↗
9. Efimov · Opt. Mater. · 2001 · 17 · 37910.1016/S0925-3467(01)00062-3 ↗
10. Teteris · Latvian J. Phys. Technol. Sci. · 1995 · 2 · 3
11. Ozols · Radiat. Effects Defects Solids · 2002 · 257 · 116710.1080/10420150215762 ↗
12. Pfeiffer · J. Non-Cryst. Solids · 1991 · 130 · 11110.1016/0022-3093(91)90449-G ↗
13. Ozols · J. Appl. Phys. · 1994 · 75 · 332610.1063/1.356141 ↗
14. Teteris · J. Opt. Soc. Am. B · 1997 · 14 · 249810.1364/JOSAB.14.002498 ↗
15. Teteris · Latvian J. Phys. Technol. Sci. · 1992 · 2 · 55
16. Kumar · Thin Solid Films · 1986 · 135 · L1310.1016/0040-6090(86)90100-8 ↗
17. Pfeiffer · J. Non-Cryst. Solids · 1987 · 97&98 · 37910.1016/0022-3093(87)90089-5 ↗
18. Lyubin · J. Non-Cryst. Solids · 1994 · 171 · 8710.1016/0022-3093(94)90035-3 ↗
19. N.F. Mott, E.A. Davis, Electronic Processes in Non-Crystalline Materials, Clarendon, Oxford, 1979.
20. Ozols · J. Opt. A: Pure Appl. Opt. · 2004 · 6 · S13410.1088/1464-4258/6/3/022 ↗
21. Stradins · J. Non-Cryst. Solids · 1989 · 114 · 7910.1016/0022-3093(89)90074-4 ↗
22. Burdyan · Neorg. Mater. (Inorganic Materials) · 1995 · 31 · 127
23. Klinger · Usp. Fiz. Nauk · 1987 · 152 · 62310.3367/UFNr.0152.198708d.0623 ↗