Structure and reactivity of amorphous silicon nitride investigated with density-functional methods
Source abstract
Abstract
Abstract We present the first results of our investigation of amorphous silicon nitride using ab initio total energy and molecular dynamics methods. The structural models of a-Si3N4 and a-Si3N4:H are based on continuous random alternating networks. The strong chemical order and the absence of like-atom bonds such as Si–Si and N–N bonds is maintained even after ab initio molecular dynamic simulations at elevated temperatures. The modeling results in two structures for a-Si3N4 with densities of 3.2 and 2.6 g/cm 3 , each consisting of 112 atoms. Both structures have very few topological defects, in total only one three-connected Si is present. Although the low-density structure contains a pore, there is no detectable trend of total energy or average connectivity with density. By discarding selected atoms and terminating dangling bonds with hydrogen, two models of a-Si3N4:H were constructed free of under-coordinated atoms and with densities of 2.8 and 2.5 g/cm 3 . The hydrogenated models show less distortion of bond lengths and bond angles in comparison to the hydrogen-free models. The density of states (DOS) of the band gap region indicates the presence of gap states that determine the reactivity of the phase.
Source: openaire · Quality: candidate unverified · Source record ↗
Research context
OpenAlex topics: Glass properties and applications · Silicon Nanostructures and Photoluminescence · Thin-Film Transistor Technologies
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (18)
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