Nanoscale Characterization for the Classroom
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Research context
OpenAlex topics: Force Microscopy Techniques and Applications · Electrochemical Analysis and Applications · Nanotechnology research and applications
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References (9)
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3. Sarid D., 1997. Exploring Scanning Probe Microscopy with Mathematica, John-Wiley & Sons Publishers, NY.
4. Carroll D.L., Redlich Ph., Ajayan P.M., Charlier J.C., Blase X., De Vita A. and Car R., 1997. Physical Review Letters 78(14), 2881.10.1103/PhysRevLett.78.2811 ↗
5. Bonnell D.A., Huey B. and Carroll D.L., 1995. Solid State Ionics 74, 35–42.10.1016/0167-2738(94)00180-Z ↗
6. Paesler M. and Moyer P., 1996. Near-Field Optics; Theory, Instrumentation, and Applications. John-Wiley & Sons Publishers, NY.
7. Paesler M., Moyer P., Jahncke C.J., Johnson C.E., Reddick R.C., Warmack R.J. and Ferrell T.L., 1990. Phys. Rev. B 45, 6750.10.1103/PhysRevB.42.6750 ↗
8. Egerton R.F., 1996. Electron Energy-Loss Spectroscopy in the Electron Microscope, 2nd edition, Plenum Pub Corp., NY.10.1007/978-1-4757-5099-7 ↗
9. Ebbesen T. and Hiura H., 1995. Advanced Materials 7(6), 582.10.1002/adma.19950070618 ↗