Error Analysis and Permittivity Measurements with Re-Entrant High-Temperature Dilectrometere
Source abstract
Abstract
A comprehensive error analysis of a high temperature dielectrometer system is given. Pertinent measurement techniques, especially those affecting the measurement accuracy, are described. Experimental results of dielectric measurements from room temperature to 1500°C on a selection of ceramics are presented.
Source: openalex_inverted_index · Quality: baseline
Research context
OpenAlex topics: Sensor Technology and Measurement Systems · Calibration and Measurement Techniques · Gas Sensing Nanomaterials and Sensors
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (5)
Show source-provided references
1. Bansal, N.P. and Doremus, R.H. 1986. Handbook of Glass Properties. Academic Press, New York, NY.10.1016/B978-0-08-052376-7.50013-8 ↗
2. Doremus, R.H. 1973, Glass Science. Ch. 2. 11. John Wiley & Sons, New York, NY.
3. Kingery, W.D. Bowen, H.K., and Uhlmann, D.R. 1975. Introduction to Ceramics. Ch. 18. John Wiley & Sons, New York, NY.
4. Wong, D.K. 1975. Dielectric constants of metal oxides. M. Sc. Thesis, University of Alberta.
5. Xi, W. 1992. High temperature microwave dielectrometer using a re-entrant cavity. Ph.D. Thesis, University of Alberta, Edmonton, AB, Canada.