journal article·2015-01

A Novel Technique to Measure Small Dielectric Losses Using Cylindrical Cavity Resonator at X Band

Sanjay Mondal, Salil Kumar Biswas

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Abstract

A technique has been designed to determine the relative permittivity and dielectric loss of low loss materials using a cylindrical cavity resonator at X band. This technique has been tested over some standard materials with satisfactory results compared to some existing standard methods for measuring tanS. The measurements are performed TE111 mode with the aid of Agilent E4418B EPM series power meter and Agilent 53150A 20 GHz frequency counter.
Source: openalex_inverted_index · Quality: baseline

Research context

OpenAlex topics: Microwave and Dielectric Measurement Techniques · Microwave Engineering and Waveguides · Acoustic Wave Resonator Technologies

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