journal article·2021-10-02

Machine learning approach to transform scattering parameters to complex permittivities

Robert Tempke, Liam Thomas, Christina Wildfire, Dushyant Shekhawat, Terence Musho

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Abstract

This study investigates the application of artificial neural networks to determine the complex dielectric material properties derived from experimental VNA scattering parameter measurements. The study utilizes a finite element approach to synthetically generate data to train the neural network. The neural network was trained using a supervised learning approach and validated using experimental measurement data. The frequency range of interest was between 0.1 and 13.5 GHz with the real part of the dielectric constants ranging from 1 − 100 and the imaginary part ranging from 0 − 0.2. This modelling approach decreases the uncertainty when compared to existing inverse approaches. This approach demonstrates a general framework that can be used for converting experimental or computational derived scattering parameters to complex permittivities.
Source: openalex_inverted_index · Quality: baseline

Research context

OpenAlex topics: Microwave and Dielectric Measurement Techniques · Soil Moisture and Remote Sensing · Microwave Imaging and Scattering Analysis

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

Department of Mechanical & Aerospace Engineering, West Virginia University, Morgantown, WV, USA

Oak Ridge Institute of Science and Education (ORISE), Oak Ridge, TN, USA

National Energy Technology Laboratory, US Department of Energy, Morgantown, WV, USA

Funding

NSF

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