Electrical properties of AlMn amorphous films formed by ion beam mixing
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OpenAlex topics: Semiconductor materials and devices · Ion-surface interactions and analysis · Semiconductor materials and interfaces
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References (6)
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2. Xianzheng · J Wuhan University · 1984 · 4 · 35
3. Winterbon · 1975
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5. Mooij · Phys Stat Solid · 1973 · A17 · 52110.1002/pssa.2210170217 ↗
6. Liu · Nucl Instrum Meth · 1983 · 209/210 · 22910.1016/0167-5087(83)90804-9 ↗