journal article·1985-02

Numerical simulation of optical etch rate monitoring of VLSI circuits by personal computer

Jean Canteloup, Michel Lespinasse

Vacuum· Volume 35· Issue 2
Publisher page

Abstract

No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.

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Research context

OpenAlex topics: Optical Coatings and Gratings · Surface Roughness and Optical Measurements · Laser Material Processing Techniques

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References (5)

Show source-provided references
1. Berning · 1963 · Vol. 1 · 69
2. Optics of Thin Films
3. Marcoux · Solid State Technol · 1981 · 24 · 11510.1016/0038-1101(81)90004-6 ↗
4. Heimann · 1983
5. Mise en oeuvre d'un interférométre laser informatisé pour la gravure sélective des ‘puces’ en analyse de contruction