journal article·2016-08-01

Pre-curing investigation of filling conductive paste in prepreg to interconnect two multilayer structures of backboard for press-fit application

Shouxu Wang, Ting Yang, Yuanming Chen, Wei He, Yongsuan Hu, Xinhong Su

Circuit World· Volume 42· Issue 3
Publisher page

Abstract

Purpose The purpose of this paper is to form high density interconnection (HDI) of backboard for press-fit applications with the pre-curing conditions of conductive paste. The best condition of pre-curing conductive paste should be found to obtain good electrical and physical performance of the conductive paste and avoid the simultaneous curing behavior of prepreg. Design/methodology/approach A novel structure of backboard was designed by using the connection of conductive paste-filled through holes to connect two multilayers. Pre-curing conditions of conductive paste were investigated to find their effects on resistance, bond strength and volume shrinkage. The reliability of pre-curing conductive paste was also analyzed. Findings Pre-curing conditions led to a great influence on the resistance, bond strength and volume shrinkage of the conductive paste. The best condition of pre-curing conductive paste was chosen as the low curing temperature of 60°C and a curing time of 30 min. Cured conductive paste exhibited square resistance of 4.205 mΩ/□ and bonding strength of 22.86 N. The as-obtained pre-curing condition could improve the reliability of conductive paste. Pre-curing process of conductive paste at extremely low temperature to interconnect two multilayer structures improved the density interconnection of backboard for press-fit applications. Originality/value The use of HDI of backboard could lead to good assembly for high-speed signal transmission of electronic products with press-fitting components. The connection of pre-curing conductive paste for multilayers could have important function for improving the application for communication backboard.
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Research context

OpenAlex topics: Electronic Packaging and Soldering Technologies · 3D IC and TSV technologies · Copper Interconnects and Reliability

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

University of Electronic Science and Technology of China State Key Laboratory of Electronic Films and Integrated Devices, , Chengdu,

University of Electronic Science and Technology of China State Key Laboratory of Electronic Films and Integrated Devices, , Chengdu, China and Research and Development Department, Guanghua Sci-Tech Co., Ltd., Shantou,

Zhuhai Founder PCB Development Co., Ltd, Zhuhai, China

References (9)

Show source-provided references
1. Plating uniformity of bottom-up copper pillars and patterns for IC substrates with additive-assisted electrodeposition
2. Study of the reliability of antenna overbrige connection with conductive silver paste
3. Nano- and micro-filled conducting adhesives for z-axis interconnections: new direction for high-speed, high-density, organic microelectronics packaging10.1108/03056120810848743 ↗
4. Novel interconnection method using electrically conductive paste with fusible filler10.1007/s11664-005-0071-z ↗
5. Problems of PCB microvias filling by conductive paste10.1016/j.microrel.2006.02.018 ↗
6. Elastic, elastic-plastic and creep analyses of wafer level chip scale package solder joints on microvia build-up printed circuit boards10.1108/03056120110360282 ↗
7. An overview of microvia technology10.1108/03056120010310891 ↗
8. Filling through holes and blind microvias with copper using reverse pulse plating and insoluble anodes10.1108/03056121211250632 ↗
9. Factors governing filling of blind via and through hole in electroplating10.1108/CW-05-2014-0019 ↗