article·1999-08-01

Changes in the microstructure of GaN layers on sapphire upon annealing at high pressure

J. Z. Domagała, M. Leszczyński, T. Suski, J. Jun, P. Prystawko, H. Teisseyre

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OpenAlex topics: GaN-based semiconductor devices and materials · Semiconductor Quantum Structures and Devices · ZnO doping and properties

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