journal article·2018-10-26

Critical Factors in the Growth of Hyperdoped Germanium Microwires by Electrochemical Liquid–Liquid–Solid Method

Saurabh Acharya, Luyao Ma, Stephen Maldonado

ACS Applied Nano Materials· Volume 1· Issue 10
Publisher page

Abstract

Factors that affect crystalline growth of germanium (Ge) micro- and nanowires by the electrochemical liquid–liquid solid (ec-LLS) method in water have been identified. Alloys of gallium and indium (Ga1–xInx) were used as liquid metal microdroplet electrodes in ec-LLS to determine whether the resultant conductivity of as-grown Ge could be strongly modulated by adjusting the fraction of Ga. Current–potential measurements on individual microwires were performed as a function of alloy composition. All alloys of Ga and In yielded Ge microwires with low resistivity and showed evidence of metal incorporation beyond the solubility limit (i.e., hyperdoping). The observed Ge crystal growth rates were insensitive to the alloy composition. In contrast, lowering the concentration of GeO2 dissolved in solution and/or increasing the density of droplets noticeably slowed down the microwire growth rate. Cumulatively, these data help define what parameters should be useful in refining the ec-LLS method to produce materials with specific targeted properties.
Source: openalex_inverted_index · Quality: baseline

Research context

OpenAlex topics: Nanowire Synthesis and Applications · Silicon Nanostructures and Photoluminescence · Molecular Junctions and Nanostructures

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

Department of Electrical Engineering and Computer Science, University of Michigan, Ann Arbor, Michigan 48109-1055, United States

Department of Chemistry, University of Michigan, Ann Arbor, Michigan 48109-1055, United States

Program in Applied Physics, University of Michigan, Ann Arbor, Michigan 48109-1055, United States

Funding

Division of Chemistry

References (53)

Show source-provided references
1. Capper P. · 200710.1002/9780470319505 ↗
2. 10.1146/annurev.matsci.34.040203.11230010.1146/annurev.matsci.34.040203.112300 ↗
3. 10.1088/0022-3727/39/21/R0110.1088/0022-3727/39/21/R01 ↗
4. 10.1021/ic060498r10.1021/ic060498r ↗
5. 10.1149/1.210865110.1149/1.2108651 ↗
6. 10.1143/JJAP.23.L84310.1143/JJAP.23.L843 ↗
7. 10.1021/acs.accounts.5b0015810.1021/acs.accounts.5b00158 ↗
8. 10.1021/nn503784d10.1021/nn503784d ↗
9. 10.1134/S106378261708011510.1134/S1063782617080115 ↗
10. 10.1021/acs.cgd.7b0103610.1021/acs.cgd.7b01036 ↗
11. 10.1021/acs.cgd.6b0136010.1021/acs.cgd.6b01360 ↗
12. 10.1021/acs.chemmater.5b0064410.1021/acs.chemmater.5b00644 ↗
13. 10.1021/nl404228z10.1021/nl404228z ↗
14. 10.1021/ja205299w10.1021/ja205299w ↗
15. 10.1007/BF0266367710.1007/BF02663677 ↗
16. 10.1002/j.1538-7305.1960.tb03928.x10.1002/j.1538-7305.1960.tb03928.x ↗
17. 10.1016/0022-0248(95)00248-010.1016/0022-0248(95)00248-0 ↗
18. 10.1088/0957-4484/22/39/39560110.1088/0957-4484/22/39/395601 ↗
19. 10.1021/acsnano.7b0724810.1021/acsnano.7b07248 ↗
20. 10.1007/s00706-018-2191-110.1007/s00706-018-2191-1 ↗
21. 10.1021/acs.chemmater.5b0132710.1021/acs.chemmater.5b01327 ↗
22. 10.1103/PhysRev.90.52110.1103/PhysRev.90.521 ↗
23. Bard A. J. · 1980
24. 10.1073/pnas.141222711110.1073/pnas.1412227111 ↗
25. 10.1115/1.243658210.1115/1.2436582 ↗
26. 10.1186/s40486-015-0017-z10.1186/s40486-015-0017-z ↗
27. Takeno N. · 2005
28. 10.1021/acsenergylett.6b0061510.1021/acsenergylett.6b00615 ↗
29. 10.1021/nl301912f10.1021/nl301912f ↗
30. Sze S. M. · 200610.1002/0470068329 ↗
31. 10.1007/BF0288041110.1007/BF02880411 ↗
32. Crank J. · 1975
33. 10.1039/b415395m10.1039/b415395m ↗
34. 10.1039/tf966620352410.1039/tf9666203524 ↗
35. 10.1149/1.242350210.1149/1.2423502 ↗
36. 10.1016/S0022-0728(71)80120-110.1016/S0022-0728(71)80120-1 ↗
37. 10.1002/j.1538-7305.1961.tb01627.x10.1002/j.1538-7305.1961.tb01627.x ↗
38. 10.1016/j.sse.2004.08.00610.1016/j.sse.2004.08.006 ↗
39. 10.1116/1.293925610.1116/1.2939256 ↗
40. 10.1109/EDL.1982.2550210.1109/EDL.1982.25502 ↗
41. 10.1016/j.pcrysgrow.2015.11.00110.1016/j.pcrysgrow.2015.11.001 ↗
42. 10.1063/1.497851210.1063/1.4978512 ↗
43. 10.1038/ncomms1140510.1038/ncomms11405 ↗
44. 10.1039/C5CC03639A10.1039/C5CC03639A ↗
45. 10.1021/acs.chemmater.7b0396910.1021/acs.chemmater.7b03969 ↗
46. 10.1007/BF0270918910.1007/BF02709189 ↗
47. Mei, Z.; Hua, F.; Glazer, J.; Key, C. C. Low Temperature Soldering. Twenty First IEEE/CPMT International Electronics Manufacturing Technology Symposium Proceedings, 1997 IEMT Symposium, 13–15 Oct. 1997; Institute of Electrical and Electronics Engineers: New York, 1997; pp 463–476.
48. 10.1007/s10854-006-9010-x10.1007/s10854-006-9010-x ↗
49. 10.1021/nn505404y10.1021/nn505404y ↗
50. 10.1039/C5TC03898G10.1039/C5TC03898G ↗
51. 10.1021/nn501403v10.1021/nn501403v ↗
52. 10.1149/2.0691609jes10.1149/2.0691609jes ↗
53. 10.1021/ja109398t10.1021/ja109398t ↗