journal article·1999-11

Growth of polycrystalline SiC films on SiO 2 and Si 3 N 4 by APCVD

Chien Hung Wu, Christian A. Zorman, Mehran Mehregany

Thin Solid Films· Volume 355-356
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Abstract

No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.

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Research context

OpenAlex topics: Thin-Film Transistor Technologies · Diamond and Carbon-based Materials Research · Copper Interconnects and Reliability

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References (8)

Show source-provided references
1. A.J. Fleischman, X. Wei, C.A. Zorman, M. Mehregany, Procceedings of the 7th International Conference on SiC, III-Nitrides and Related Materials, Stockholm, Sweden, Aug. 31-Sep. 5, 1997. Trans Tech Publications Ltd, Switzerland,1998, p. 885.10.4028/www.scientific.net/MSF.264-268.885 ↗
2. Technical Digest - 12th IEEE International Conference on Micro Electro Mechanical Systems
3. DeAnna · J. Chem. Vapor Depos. 6 · 1999 · 280
4. Zorman · J. Appl. Phys. · 1995 · 78 · 513610.1063/1.359745 ↗
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8. J. Bloem, in: T.O. Sedgwick, H. Lydtin, (Eds.), Proceedings of the 7th International Conference on CVD, The Electrochemical Society Proceedings. Vol. 79-3, 1979, p. 41.