Near infra-red Mueller matrix imaging system and application to retardance imaging of strain
Source abstract
Abstract
We report on the design and performance of a near infra-red Mueller matrix imaging ellipsometer, and apply the instrument to retardance imaging of strain in near infra-red transparent solids. Particularly, we show that the instrument can be used to investigate complex strain domains in multi-crystalline silicon wafers.
Source: openaire · Quality: candidate unverified · Source record ↗
Research context
OpenAlex topics: Optical Polarization and Ellipsometry · Optical measurement and interference techniques · Leaf Properties and Growth Measurement
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