article·2003-05-01

Majority carriers in pyrite thin films: an analysis based on Seebeck and Hall coefficient measurements

J.R. Ares, Isabel J. Ferrer, C. Sánchez

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Abstract

Determination of the sign of the majority charge carriers in pyrite thin films has become a difficult task due to the contradictory results obtained by thermoelectric methods and Hall coefficient measurements. An explanation for this behaviour is proposed on the basis of calculations accomplished by considering a two band conduction mechanism operating in the films. Point lattice defects, generated during the film growth, are considered as donor and acceptor states.
Source: openaire · Quality: candidate unverified · Source record ↗

Research context

OpenAlex topics: Metal Extraction and Bioleaching · Surface and Thin Film Phenomena · Copper-based nanomaterials and applications

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